ASIA PHOTONICS EXPO (APE) 2025Products & Services TopMap Micro.View® | Table-top optical surface profiler

TopMap Micro.View® | Table-top optical surface profiler

Exhibitor
Polytec

TopMap Micro.View is an easy to use and compact optical profiler. Combine exceptional performance and affordability with this powerful metrology solution.

  • High-end white-light interferometer with nm resolution

  • 100 mm z measurement range with CST Continuous Scanning Technology

  • With Focus Finder and Focus Tracker ready for automation

  • Motorized X, Y, Z, tip/tilt and turret save repositioning

  • Color information mode for extended analysis and documentation of defects

  • Modular, application-specific configurations

Further reading

Topography and dynamics of MEMS and microsystems

TopMap Micro.View table-top optical 3D surface profiler. CST Continuous Scanning Technology allows to use the entire 100 mm positioning range as measurement range

Topography and dynamics of MEMS and microsystems

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