The SENresearch 4.0 spectroscopic ellipsometer covers the widest spectral range from 190 nm (deep UV) to 3,500 nm (NIR). High spectral resolution is offered to analyse even thick films up to 200 µm thickness using FTIR ellipsometry.

The SENTECH SENresearch 4.0 spectroscopic ellipsometer covers the widest spectral range from 190 nm (deep UV) to 3,500 nm (NIR). High spectral resolution is offered to analyse even thick films up to 200 µm thickness using FTIR ellipsometry. There are no moving optical parts during data acquisition for best measurement results. The Step Scan Analyser (SSA) principle is a unique feature of the SENresearch 4.0 spectroscopic ellipsometer. The extension of the SSA principle by the innovative 2C design allows measurement of the full Mueller matrix. The 2C design is a field upgradable and cost-effective accessory.