NanoTest performs optical and electrical characterization for Silicon Photonics Devices on wafer and chip level, VCSEL wafers, laser bars and CoS and High-Density PICs.

 All NanoTest stations combine precise measurements with high speed, proven reliability and ease of use. The versatility qualifies the stations not only for high volume quality assurance, but also for demanding development applications.

The graphic interface displays panels for system functions, such LIV curves, OSA measurement and S factors of the network measurements.

 All measured data can be stored in a local database or transferred into the customer’s system.