The LumiTop 5300 is optimized for fast, high-dynamic-range measurements of modulated light emitters and precise pixel-level evaluation on display wafers. A wide range of objective lenses supports versatile measurement tasks across flat-panel displays, AR/VR optics, microdisplays and MicroLED wafer testing. Its 24 MP resolution enables accurate single-emitter characterization, while flexible magnification options allow detailed inspection across different wafer layouts and device sizes. Ideally suited for demura correction, defect detection and uniformity analysis, the system delivers reliable performance in both R&D and production. A hardware trigger ensures precise synchronization to the modulation signal for stable, repeatable measurement results.